Organic and Inorganic Metal Halide Tandem Scintillator for Dual-Energy Flat-Panel X-ray Imaging
Traditional indirect flat-panel X-ray imaging (FPXI) uses inorganic scintillators with high-Z elements, which lack spectral information about X-ray photons and reflect only integrated X-ray intensity. To address this issue, we developed a stacked scintillator structure that combines organic and inorganic materials. This structure allows X-ray energies to be distinguished in a single shot by using a color or multispectral visible camera. However, the resolution of the resulting dual-energy image is primarily limited by the top scintillator layer. We inserted a layer of anodized aluminum oxide (AAO) between the double scintillators. This layer limits the lateral propagation of scintillation light, improves imaging resolution, and acts as a filter for X-rays. Our research demonstrates the advantages of stacked organic–inorganic scintillator structures for dual-energy X-ray imaging and provides novel and practical applications for relatively low-Z organic scintillators with high internal X-ray-to-light conversion efficiency.
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