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Using a CdS under-layer to suppress charge carrier recombination at the Ag2S/FTO interface

Hong Chen,Yan Lei,Xiaogang Yang,Chaoliang Zhao,Zhi Zheng

The recombination of photoinduced charge carriers is detrimental to the photovoltaic performance of solar cells. In this work, we used CdS as an under-layer to reduce the recombination of photoinduced charge carriers at the Ag 2 S/FTO (F-doped SnO 2 ) interface. The CdS under-layer was deposited onto an FTO substrate using a facile chemical bath deposition (CBD) method. By controlling the thickness of the CdS film between Ag 2 S and FTO, the recombination of photoinduced charge carriers was successfully suppressed. The effect of the CdS under-layer on the charge carrier recombination was carefully evaluated by transient surface photovoltage (TSPV) measurements, electrochemical impedance spectroscopy (EIS) and a photoelectrochemical method. The power conversion efficiency (PCE) of solar cell devices with a 40 nm CdS under-layer is 1.16%, which is ~52% enhancement compared to those of FTO/Ag 2 S-based solar cell devices. Our work may provide a useful strategy to suppress photoinduced charge carrier recombination at the electrode and absorber semiconductor interface.