Influence of GLZ doping on the microstructure and electrical property of BCST Pb-free piezoceramics
(Ga 0.5 Li 0.5 )ZrO 3 doped lead-free piezoceramics (Ba 0.93 Ca 0.07 )(Sn 0.08 Ti 0.92 )O 3 {which was abbreviated as (1- x )BCST- x GLZ} were fabricated via traditional solid-state method. Microstructures and electrical properties of all samples were studied in detail using XRD , SEM, TEM, piezoelectric response, dielectric temperature spectrum, and ferroelectric hysteresis loop. Based on the experimental results, all the as-prepared samples possessed pure ABO 3 perovskite structure. Single tetragonal (T) phase was obtained at x = 0 and 0.5 mol %, but the coexistence of orthorhombic-tetragonal (O-T) phase constructing MPB was obtained at 0.1 ≤ x ≤ 0.4 mol %. There was an initial increase in the grain size, which subsequently decreased. However, there was an initial reduction in the point defects ( i.e. , vacancies and pores, etc. ), which then increased. The specimen possessed nanoscale lamellar domains and monocrystal structure at 0.2 mol %. All samples acquired good electrical property, especially for the sample at 0.2 mol %. It was confirmed that all specimens were relaxor ferroelectrics.
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