摘要
Suppressing defects at the interface between the TiO 2 electron transport layer (ETL) and perovskite film is critical for high efficiency and stable perovskite solar cells (PSCs). Herein, a siloxane derivative diethylphosphatoethylsilicic acid (PSiOH) is developed to modify the interface of TiO 2 ETL/FA 0.83 Cs 0.17 PbI 3 perovskite. Comprehensive characteristics reveal that silicon hydroxyl ( Si OH) in PSiOH can reduce surface defects, improve the electrical properties and optimize the energy band structure of TiO 2 by forming a Si O Ti bond, while the phosphate bond ( PO) in PSiOH can passivate Pb-related defects on the perovskite bottom surface. Consequently, PSiOH-modified PSCs yield a remarkable power conversation efficiency of 24.20% and improved air, thermal, or illumination stabilities. This study provides insight into passivation defects at the buried interface for efficient and stable PSCs.
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