Interaction quantitative modeling of mixed surfactants for synergistic solubilization by resonance light scattering

In situ flushing through surfactant-enhanced aquifer remediation (SEAR) technology has long been recognized as a promising technique for NAPL removal from contaminated aquifers. However, there have been few studies on the choice of surfactants. In this work, the interaction quantitative model between resonance light scattering intensity and the concentration of binary surfactant mixtures NP-10+SDBS and NP-10+CTAB was established, and the mechanism of binary surfactant interaction was explored through the model by the resonance light scattering method. The relationship between the model constants and NAPL solubilization was also investigated to better address the application of surfactants in practical NAPL-contaminated site remediation. The critical micelle concentrations (CMCs) of nonylphenol ethoxylate (NP-10), dodecyl benzene sulfonate (SDBS), hexadecyl trimethyl ammonium bromide (CTAB), and the binary surfactant mixtures were measured by resonance light scattering (RLS), which were consistent with those obtained from surface tension measurements. In all cases, the RLS signals exhibited similar variations with surfactant concentration. A quantitative calculation model based on the RLS measurement data was established, and the binding constants K NP-10+SDBS and K NP-10+CTAB were calculated to be 0.66 and 1.51 L·mmol −1 , respectively, according to the equilibrium equations. The results showed that the binding constants have a significant positive correlation with NAPL solubilization.