摘要
Achieving large Fermi energy splitting under illumination is critical for improving the performance of photovoltaic devices. In this work, we conducted the energy band structure modulation of MoS 2 thin films via MoO x doping scheme to realize its photovoltaic operation on n-type c-Si by magnetron sputtering. It is found that, by capping a MoO x overlayer, the MoS 2 electrons density decreased and the Fermi level shifted ~0.4 eV towards valence band, consequently the MoS 2 conductive type changing. With this doped MoS 2 layer, the built-in electric field of fabricated MoS 2 /n-Si heterojunction devices greatly improved and exceeded 400 mV owing to the larger interface energy-level differences. Meanwhile, the defects recombination losses reduced benefiting from the holes-selective behavior of O-deficiencies in MoO x , so that the photo-generated carriers extraction process were promoted. As a result, the doped MoS 2 /n-Si devices showed excellent rectification behavior with rectifying ratio to 10 5 and ideality of 1.12. The TRPL spectrums corroborated the enhanced carrier transport mechanism at MoS 2 /n-Si interface by MoO x modulation doping effect. Correspondingly, the significant improvement of doped MoS 2 /n-Si solar cells performance (V oc of 289 mV, FF of 60.72% and J sc of 31.25 mA/cm 2 ) was achieved, exhibiting an optimized conversion efficiency of 5.47%. The UPS analysis revealed that the doping mechanism of MoO x /MoS 2 stacks lies in energy band overlap and electrons contact transfer between these two materials. This observation of MoO x modulation doping effect on large-area sputtering MoS 2 could help in building a better interface carrier transport in photovoltaic and optoelectronic applications of 2D materials.
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