摘要
The optoelectrical properties of semiconductor devices are strongly related to the film morphology. Here, we found that, for CsPbBr 3 thin films prepared by spray coating, the addition of polymethyl methacrylate (PMMA) can completely eliminate voids and greatly reduce the surface roughness of the as-deposited films. As a consequence, the optoelectronic properties of the photodetectors fabricated as a simple vertical structure of Au/CsPbBr 3 (PMMA)/ITO can be improved. With the addition of PMMA, the dark current of the photodetector is reduced at least four times, and the photodetector exhibits a favourable optical response. With the illumination ranging from 400 to 510 nm, the calculated responsivity varies from 3.70 to 5.20 A/W. A good response speed with a rise time of 6.6 ms and a decay time of 11.3 ms can be achieved. Moreover, unlike the inorganic-organic hybrid perovskite detectors, this inorganic perovskite photodetector without encapsulation shows a favourable stability with a decay of 20% after 40 days under ambient air at 20% humidity.
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