摘要
Doping with tetravalent titanium cation impurities is an effective means to enhance the performance of hematite (α-Fe 2 O 3 ) photoanodes. These nevertheless face problems of inefficient activation of impurity donors, which thereby impairs the photoelectrochemical water oxidation property of hematite. Herein, we propose a simple method to activate Ti 4+ dopants in spray-pyrolyzed hematite thin films via a rapid thermal annealing (RTA) treatment. The donor carrier density of Ti-doped Fe 2 O 3 thin films (doping level, i.e., Ti/Fe: 0.5–10%) is significantly increased by RTA at 700 °C for 30 s, for instance, ca. 1.35 × 10 19 cm −3 at the doping level of 5% (5%-Ti:Fe 2 O 3 -700). This is 19.3 times as high as those treated by traditional annealing in a muffle furnace at 500 °C for 1800 s (5%-Ti:Fe 2 O 3 -500). A photocurrent density of 5%-Ti:Fe 2 O 3 -700 for water oxidation reaches 0.91 mA cm −2 at 1.23 V vs. RHE. This is ca. 6-fold higher than 5%-Ti:Fe 2 O 3 -500. Electrochemical impedance spectroscopy , XRD, Raman spectroscopy, and scanning probe microscopy measurements suggest that RTA performs more efficiently than traditional annealing for promoting the substitutional incorporation of Ti 4+ cations into the hematite lattice. This simple RTA treatment for donor-activation should be applicable to other semiconductor-dopant combinations—thin films or nanostructures , for the development of high-performance photoanodes for water oxidation.
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