摘要
Novel Lu 2 WO 6 :Eu 3+ films with excellent luminescence performance were successfully prepared by Pechini method for the first time and characterized with X-ray diffraction (XRD), micro X-ray fluorescence imaging (μ-XRF), atomic force microscope (AFM), and X-ray excited luminescence (XEL), etc. Eu 3+ -doped films emitted strong red light peak wavelength at 612 nm under both UV light or X-ray excitation. The optimal annealing temperature and Eu 3+ -doped concentration are around 950 °C and 10 mol%, respectively. In addition, luminescence mechanism associated with Eu 3+ site occupation and possible energy transfer of Lu 2 WO 6 :Eu 3+ films have also been proposed. The optimized thin film shows great potential for applications as a candidate for X-ray imaging due to its high density, suitable emission wavelength and high light yield.
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