摘要
Regulating bulk carrier separation and surface reaction kinetics is critical for effective photoelectrochemical water splitting. Here, we simultaneously address these challenges by constructing a heterojunction through in situ thermal reconstruction of CdIn 2 S 4 , which generates an amorphous InO x passivation layer to stabilize the surface while Ru single-atom sites accelerate hole injection. This dual modification synergistically enhances charge separation and interfacial kinetics, yielding an applied bias photon-to-current efficiency (ABPE) of 2.11 % at 0.45 V and a photocurrent density of 4.56 mA cm −2 at 1.23 V vs. RHE. Combined theoretical and experimental analyses reveal that the InO x layer suppresses recombination, while Ru single atoms lower the energy barrier for oxygen evolution reaction by modifying rate-determining steps. This work demonstrates surface reconstruction as a versatile route to optimize both stability and catalytic activity in metal sulfide photoanodes.
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