摘要
The increasing demand for radiation detection in applications like medical diagnostics and security inspection drives scintillator research. Traditional scintillators are limited by toxicity, crystallization challenges, and high production costs. A one-step chemical vapor deposition (CVD) method is developed to produce high-purity, large-area, and uniform Cs 3 Cu 2 Cl 5 microcrystalline film. This material utilizes a unique self-trapped exciton (STE) emission mechanism, resulting in significant Stokes shift of 241 nm and a high photoluminescence quantum yield (PLQY). It offers new opportunities for converting X-ray and high-energy radiation. It shows a linear RL intensity increase with dose rates (25–188 µGy s −1 ), excellent dose-response linearity, and high absorption coefficients comparable to commercial scintillators. This X-ray imaging system allows for high-resolution visualization of internal chip structures even at low doses. This work establishes a controllable synthesis method for large-area scintillator films and highlights the potential of Cs 3 Cu 2 Cl 5 microcrystalline film as a next-generation scintillators materials.
危险品化学品经营许可证(带存储)