摘要
Accurately probing the interiors of curved objects with direct X-ray detection remains a formidable challenge. Here, a novel Ga2O3–TeO2 glass (GTOG) with the advantages of shape-controllable, large-area preparation, and a simple preparation process has been developed. Owing to its high electrical resistivity and carrier mobility-lifetime product, a flat-panel GTOG detector exhibits an ultralow detection limit of 8.579 nGyair s–1 and a high sensitivity of 321.47 μC Gy–1 cm–2 under 40 keV X-ray radiation. Furthermore, under 120 keV X-ray radiation, the sensitivity of the GTOG X-ray detector is enhanced to 484.98 μC Gy–1 cm–2 at 175 °C, which has potential applications in high-temperature environments. Leveraging its shape-controllability, we fabricated a curved X-ray detector using a low-temperature melting process. The curved array detector demonstrates significantly clearer and less distorted images in curved object detection compared to those of the flat-panel detector. This achievement suggests that a glass with adjustable bending radii can serve as a paradigm for future shapeable X-ray detectors, unlocking new possibilities for three-dimensional (3D) curved X-ray imaging.
危险品化学品经营许可证(带存储)