Polarization-Sensitive Ultraviolet Detection from Oriented-CdSe@CdS-Dot-in-Rods-Integrated Silicon Photodetector

Polarization can be used to distinguish artificial objects in complicated environments. The development of polarization-sensitive detection at ultraviolet (UV) wavelengths has been substantially delayed by the difficulties in fabricating anisotropic materials and optical elements for polarization modulation. Polarization-sensitive UV detection is developed by combining an electron-multiplying charge-coupled device (EMCCD) with a polarized luminescence downshifting material that benefits from an oriented-CdSe@CdS-dot-in-rods-embedded polyvinylidene fluoride (PVDF) composite film. With mechanical-stretching-induced orientation, the composite film shows emission polarization with an optimized ratio up to 0.52 ± 0.02. This integrated detection system can respond to linearly polarized 405 nm light with a signal difference up to 23%, showing its potential for use in UV polarization-enhanced imaging for object recognition.