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Patterned Growth of P-Type MoS2 Atomic Layers Using Sol–Gel as Precursor

Journal 2016 · IF 11.382 · 26(35): 6371-6379 · 发表于 2016 年 7 月 19 日
作者: Wei Zheng,Junhao Lin,Wei Feng,Kai Xiao,Yunfeng Qiu,XiaoShuang Chen,Guangbo Liu,Wenwu Cao,Sokrates T. Pantelides,Wu Zhou,PingAn Hu
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摘要

2D layered MoS 2 has drawn intense attention for its applications in flexible electronic, optoelectronic, and spintronic devices. Most of the MoS 2 atomic layers grown by conventional chemical vapor deposition techniques are n-type due to the abundant sulfur vacancies. Facile production of MoS 2 atomic layers with p-type behavior, however, remains challenging. Here, a novel one-step growth has been developed to attain p-type MoS 2 layers in large scale by using Mo-containing sol–gel, including 1% tungsten (W). Atomic-resolution electron microscopy characterization reveals that small tungsten oxide clusters are commonly present on the as-grown MoS 2 film due to the incomplete reduction of W precursor at the reaction temperature. These omnipresent small tungsten oxide clusters contribute to the p-type behavior, as verified by density functional theory calculations, while preserving the crystallinity of the MoS 2 atomic layers. The Mo containing sol–gel precursor is compatible with the soft-lithography techniques, which enables patterned growth of p-type MoS 2 atomic layers into regular arrays with different shapes, holding great promise for highly integrated device applications. Furthermore, an atomically thin p–n junction is fabricated by the as-prepared MoS 2 , which shows strong rectifying behavior.