摘要
The inferior heterojunction quality and misaligned energy levels at the buffer/absorber interface cause severe interface recombination and large open-circuit voltage ( V OC ) loss, limiting the power conversion efficiency (PCE) of antimony selenosulfide (Sb 2 (S,Se) 3 ) solar cells. Here, we develop a field-effect passivation strategy by introducing a low-work-function Ta 2 O 5 dielectric layer between the CdS and Sb 2 (S,Se) 3 layers. This Ta 2 O 5 layer serves as an optimal substrate for growing highly crystalline Sb 2 (S,Se) 3 films while also enhancing interfacial charge transport. The positive fixed charges in Ta 2 O 5 strengthen the built-in electric field and promotes electrons extraction while suppressing holes accumulation at the interface, thereby substantially suppressing non-radiative recombination probabilities. Implementing this passivation strategy yields a record PCE of 10.95% (10.65% certified) an V OC of 695 mV, corresponding to a remarkably low voltage deficit. This work establishes a universal physical passivation paradigm for interface quality optimization and V OC loss mitigation in high-performance Sb 2 (S,Se) 3 photovoltaics.
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